News & Exhibitions
05/11/09 Taylor Hobson Launches the Talysurf CCI Lite Non Contact 3D Optical Profiler
The Talysurf CCI range of non contact optical 3D profiler from Taylor Hobson, an acknowledged leader in metrology design and manufacturing, bring an unparalleled level of performance to non-contact 3-D measurement. The Talysurf CCI Lite is a new product utilising this world leading technology but designed specifically to bring this high level of performance within reach of the global manufacturing and research market.
The Talysurf CCI is based around the Coherence Correlation Interferometry technique (Taylor Hobson patented) which provides both long scan ranges and a single mode of operation, avoiding the compromises associated with both phase mode and vertical scanning (white light) mode. The result is a non-contact 3D surface texture, step height and micro dimensional measurement system that can provide results in seconds. The sensitivity of the coherence correlation algorithm to low light levels leads to a very versatile instrument.
All types of rough or highly reflective materials, including glass, metal, photo resist, polymer, liquid inks and pastes, can be measured without difficulty. The instrument is an invaluable tool in the manufacture of automotive components, bearings, MEMS (micro electro-mechanical systems), super-polished optical components, semiconductor devices and many other applications.
The Talysurf CCI lite includes many automation features not normally found on tabletop systems, these include automatic pattern measurement, X, Y stitching and z stitching. The unique Z stage is closed loop over its full 100 mm range leading to very high accuracy Z stitching. Careful design and construction assures stability throughout the measuring loop, an important requirement for high quality metrology.
The system is offered as standard with a high sensitivity 1 million pixel image sensor for excellent data resolution in the X and Y axes and combined with a very low missing data rate; class leading surface detail is achieved. Lenses offering up to 6.6 mm field of view are available; larger field of view enables faster stitching as fewer images are required. A turret is also available to improve easy of use when multiple lenses are required.
Measurement set up is simple. Place a component onto the positioning stage, focus on the surface (auto focus is included), select the Z scan range (up to 2 mm) and push the start button. Very little component preparation is required with the sample only needing to be free from contamination. New software options including auto fringe find and auto range have been developed to improve the ease of use of the system during simple scans and more complex automation routines. More complex samples can be measured using a combination of stitching, auto fringe find, auto focus, auto range fixtures, jigs and vacuum chucks. Preparation and staging of the component is greatly simplified because the measured data can be software leveled and aligned.
Routine calibration is simple and can be carried out with Taylor Hobson's traceable artifacts as well as other specialized artifacts. The routines can be used to calibrate the instrument's vertical and lateral measurement axes. The geometrical, dimensional and surface characteristics of any known artifact can therefore be easily reproduced with confidence.
Detailed measurement and analysis can be carried out automatically with the press of a button. Surface features defined by diameter, area or volume can be automatically identified, measured and sorted. Internationally recognized waviness and roughness parameters in both 3D and 2D are included.
Presentation tools include user-defined scale, viewing angle and rotation, plus photo-realistic images in monochrome or full-color, providing a natural view of 3D planar surfaces. A full package of desktop publishing tools, including templates for repetitive tests, aids consistent, comprehensive documentation of measurement results and analysis.